| Color Locate & Match |
Processes multi-spectrum color signatures to isolate, classify, and track target profiles. |
- Differentiate parts via pixel hue shades
- Identify sub-assembly wire bundle color sets
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- Read micro stylized textual serial codes
- Perform volumetric 3D profile scanning
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- Add DL-OCR License Add-on (LIC-OCR003-0100)
- Upgrade to Professional 3D Vision Tier (LIC-PRO001-0100)
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| Calibrated Gauging & Calibration |
Maps lens distortion grids to translate raw image pixel distances into real-world units. |
- Output real-world millimeter part measurements
- Auto-compensate for camera lens parallax error
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- Perform organic neural defect sweeps
- Decipher low-contrast direct part markings
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- Add DL Anomaly Detection Module (LIC-ADDON-AI)
- Activate Base Decoder DPM Framework (LIC-DPM001-0200)
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| Color Presence & Blob P/A |
Combines Standard blob pixel intensity tools with strict chromatic tolerance checking. |
- Verify correct color fluid fills or caps
- Audit multi-colored labels inside a zone
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- Evaluate complex textual matrix arrays
- Audit multi-tiered spatial overlap structures
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- Add DL-OCR License Add-on (LIC-OCR003-0100)
- Upgrade to Professional 3D Vision Tier (LIC-PRO001-0100)
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| Dual-Edge Distance Tracking |
Computes simultaneous parallel and perpendicular geometric steps between edge sets. |
- Inspect precise thread pitch tolerances
- Verify continuous part width deviations
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- Audit surface level blemish variations
- Read micro characters stamped onto casings
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- Add DL Anomaly Detection Module (LIC-ADDON-AI)
- Add DL-OCR License Add-on (LIC-OCR003-0100)
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| Color Blob Count |
Isolates, categorizes, and tallies scattered item groupings using chromatic profiles. |
- Tally distinct parts mixed on single belts
- Count specific colored pills or fasteners
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- Identify micro-fissure physical edge cracks
- Grade barcode verification standard scores
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- Apply standard flaw edge tracking tool (LIC-STD001-0100)
- Add Barcode Quality Grading software key (LIC-QBGRD-0100)
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| Advanced Pattern Flaw Tracking |
Cross-references high-resolution multi-template images to flag sub-millimeter tooling defects. |
- Flag complex assembly layout missing parts
- Catch pattern registration overlay offsets
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- Decode low-contrast direct part marks (DPM)
- Read cursive or deformed etched lot codes
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- Activate Base Decoder DPM Framework (LIC-DPM001-0200)
- Add DL-OCR License Add-on (LIC-OCR003-0100)
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| String Match & Logic Control |
Executes boolean string comparison logic arrays against scanned text or barcodes directly on the edge. |
- Validate text-to-barcode data matches
- Filter lot string sequences against reference lists
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- Run Deep Learning text OCR without tools
- Flag random organic surface variations
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- Add DL-OCR License Add-on (LIC-OCR003-0100)
- Add DL Anomaly Detection Module (LIC-ADDON-AI)
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